A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...

SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...

Process management tools company Electroglas Inc. today introduced DefectID, its automatic defect classification software. Aimed at improving manufacturing productivity and yields for wafer ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

When a good die fails test and gets scrapped, often no one notices, because false failures look identical to real ones. Yet across the industry, these phantom defects are quietly eroding yield, ...