Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

For almost two decades, scientists have been trying to move beyond silicon, the material ...

Research findings and signs of computer chip industry demands were the top subjects at the 40th Annual Microelectronic Engineering Conference April 8 at RIT. With indications of growth and novel ...