(Nanowerk Spotlight) Advances in semiconductor technology have reached a critical turning point. Silicon-based transistor technology, central to electronics, faces increasing limitations due to the ...

A new method outlines a comprehensive approach to integrated selection and implementation of pipeline leak-detection systems, yielding both lower costs and greater efficiency over the life-cycle of ...

Method validation in R&D and QC has evolved beyond statistical evaluation to become a core compliance-driven process. Today, it requires full integration into laboratory operations and the generation ...

"Our new integrated method simplifies these measurements, allowing researchers to determine luminescence lifetimes using standard camera systems," explains Soeren Ahmerkamp, who carried out the ...

In a new review article publication from Opto-Electronic Advances, Yingtao Hu, Di Liang and, Raymond G. Beausoleil from Hewlett Packard Labs discuss advanced III-V-on-silicon photonic integration.

A new technical paper titled “Characterizing the Broadband RF Permittivity of 3D-Integrated Layers in a Glass Wafer Stack from 100 MHz to 30 GHz” was published by researchers at NIST. “We present a ...

Discover how SciY is modernizing method transfer for pharma labs, and making the analyticla method transfer more digital.