Babysense Max View baby monitors have been recalled due to a fire risk. If you own the recalled VBM55 model, stop using it ...

A technical paper titled “Detection of defective chips from nanostructures with a high-aspect ratio using hyperspectral imaging and deep learning” was published by researchers at Samsung Electronics.

MILPITAS, Calif., July 10, 2018 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced two new defect inspection products, addressing two key challenges in tool and process monitoring ...