Scandump is an advanced silicon debugging technique that ingeniously repurposes DFT (Design For Testability) scan chains for functional debugging. This method allows for the extraction of states from ...

For reasons of cost, performance, power, and miniaturization, many electronic systems that once consisted of several printed circuit boards are now manufactured as a single semiconductor device. As a ...

You all know that fixing bugs in computer chips after they've been fabricated in silicon is a tedious and costly process. This is why researchers at the University of Michigan have developed a new ...

Semiconductor engineers traditionally have focused on trying to create ‘perfect’ GDSII at tape-out, but factors such as hardware-software interactions, increasingly heterogeneous designs, and the ...

San Jose, Calif., June 5, 2002 - LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded test for integrated circuits, today announced the industry's fastest solution for at-speed silicon ...

Learn how using formal verification can take you beyond the limitations of directed-random simulation when debugging silicon. A series of case studies provide real-world usage examples of Jasper ...

The domain of on-chip testability and debug continues to get better. First Silicon Solutions (FS2—Lake Oswego, Oregon), a company that specializes in hardware verification and debug technologies, is ...