Santa Cruz, Calif. — Analog and custom IC designers' wait for transistor-level statistical timing analysis at 65 nanometers and below may be coming to an end. Two recent announcements promise that the ...

While the move to advanced process technologies has enabled levels of integration to reach new heights, engineers must now work harder than ever to realize those benefits. One of the key challenges ...

A new technical paper titled “Dual-Layer Thin-Film Transistor Analysis and Design” was published by researchers at Oregon State University and Applied Materials. “A set of analytical equations is ...

Efinix turned to the Siemens mPower power integrity analysis platform to obtain the capabilities they needed for fast, accurate, full-chip EM/IR analysis of their Titanium FPGA designs. With no ...