PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Background Patients with heart failure (HF) frequently suffer from undetected declines in cardiorespiratory fitness (CRF), which significantly increases their risk of poor outcomes. However, current ...

Abstract: Accurate acquisition of wound area is crucial for clinical evaluation and monitoring the healing process in wound research. However, traditional methods relying on manual measurement and ...

Abstract: With the rapid development of intelligent power equipment and the imperative for digital transformation of the power grid, large-scale power wireless sensor network (PWSN) have become a ...

aDepartment of Surgery, Regional Academic Cancer Center Utrecht, UMC Utrecht Cancer Center & St Antonius Hospital Nieuwegein, Utrecht University, Utrecht, Netherlands bDepartment of Medical Oncology, ...